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Multitek
 Technologies logo on a black background and gray strip.
MATERIAL MICROSCOPE
MX-SZ2M
Material testing microscope

An ideal solution for detecting large Particles. It is ideal for the measurement of particle length and breadth as well as for differentiating between reflective   and non-reflective particles.

System features

  • High optical performance

  • ISO conformed detection of particles down to 20 μm

  • Differentiation between reflective(metallic) and non-reflective (plastic) particles

  • Automatic storage of magnification and camera settings for each configuration

  • Compact design, No parallax error as on stereomicroscopes, due to single beam path

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