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MATERIAL MICROSCOPE
MX-SZ2M
An ideal solution for detecting large Particles. It is ideal for the measurement of particle length and breadth as well as for differentiating between reflective and non-reflective particles.
System features
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High optical performance
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ISO conformed detection of particles down to 20 μm
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Differentiation between reflective(metallic) and non-reflective (plastic) particles
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Automatic storage of magnification and camera settings for each configuration
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Compact design, No parallax error as on stereomicroscopes, due to single beam path
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