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MATERIAL MICROSCOPE
MX-SZ2M

An ideal solution for detecting large Particles. It is ideal for the measurement of particle length and breadth as well as for differentiating between reflective   and non-reflective particles.

System features

  • High optical performance

  • ISO conformed detection of particles down to 20 μm

  • Differentiation between reflective(metallic) and non-reflective (plastic) particles

  • Automatic storage of magnification and camera settings for each configuration

  • Compact design, No parallax error as on stereomicroscopes, due to single beam path

  Leaders in Metallurgy & Metrology