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COMPOUND MATERIAL MICROSCOPE
MX-SZ3M

Measures particle length, breadth, and height where Motorized Microscope functions – except for the scanning stage and motorization of the focus drive – are not required. The high resolution optics ensure that particles down to 5 μm can be measured. Information about the third dimension is also gained.

SYSTEM FEATURES

  •   High optical performance by using objectives with high numerical aperture for the analysis

  •   ISO conformed detection of particles down to 5 μm

  •   Height evaluation of particles to estimate overall risk potential

  •   Differentiation between reflective (metallic) and non-reflective (plastic) particles

  •   Automatic storage of magnification and camera settings for each configuration

  •   Manual microscope system can also be used for metallography or other microscopic applications

  •   Sustainable system with high magnification and low calibration values for future requirements of minimum particle size.

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INDIA

201-208, 2nd Floor, Shri Krishna Complex, Opp. Gate No. 2,

Mahesh Apartments, Vasundhara Enclave,

Main Road, New Delhi–110096

Website: www.indiacalibration.com

Tel : 011-41009005 | Mob : +91-7836009222, 7836009922  

Email : service@multitek.in

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